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Journal of Applied Physics
Results: 340

#	Item
241	JOURNAL OF APPLIED PHYSICS 98, 011101 共2005兲 APPLIED PHYSICS REVIEWS–FOCUSED REVIEW Plasmonics: Localization and guiding of electromagnetic energy in metal/dielectric structures Add to Reading List Source URL: daedalus.caltech.edu Language: English - Date: 2007-07-14 18:43:06 Nanotechnology Biophysics Electromagnetism Spectroscopy Surface plasmon resonance Surface enhanced Raman spectroscopy Plasmon Nanoshell Resonance Physics Chemistry Science
242	JOURNAL OF APPLIED PHYSICS 108, 063109 共2010兲 Achieving optical gain in waveguide-confined nanocluster-sensitized erbium by pulsed excitation Gerald M. Miller,a兲 Ryan M. Briggs, and Harry A. Atwater Thomas J. Wats Add to Reading List Source URL: daedalus.caltech.edu Language: English - Date: 2010-11-22 18:22:16 Photonics Acronyms Laser
243	A Sample Japanese Journal of Applied Physics Article A.U. Thor Department of Physics, University of Someplace (Received Month date, year; accepted for publication month date, year) We study the e ects of warm water on t Add to Reading List Source URL: www.mackichan.com Language: English - Date: 2006-05-31 14:21:15 Combinatorics Factorial Number theory Mathematical analysis Mathematics Complex analysis
244 $Diffraction / Crystallography / Electron microscopy / Spectroscopy / Materials science / Reflection high-energy electron diffraction / Texture / Electron diffraction / Transmission electron microscopy / Physics / Scientific method / Science$	JOURNAL OF APPLIED PHYSICS VOLUME 93, NUMBER 1 1 JANUARY 2003 Add to Reading List Source URL: daedalus.caltech.edu Language: English - Date: 2007-07-14 19:09:24 Diffraction Crystallography Electron microscopy Spectroscopy Materials science Reflection high-energy electron diffraction Texture Electron diffraction Transmission electron microscopy Physics Scientific method Science
245	JOURNAL OF APPLIED PHYSICS VOLUME 92, NUMBER 8 15 OCTOBER 2002 Add to Reading List Source URL: daedalus.caltech.edu Language: English - Date: 2007-07-14 19:13:41 Technology Chemical vapor deposition Coatings Plasma processing Semiconductor device fabrication Thin film deposition Wire Pressure measurement Field electron emission Vacuum Physics Measurement
246	JOURNAL OF APPLIED PHYSICS VOLUME 86, NUMBER 2 15 JULY 1999 Add to Reading List Source URL: daedalus.caltech.edu Language: English - Date: 2007-07-14 19:49:32 Semiconductor device fabrication Excipients Silicon dioxide Etching Technology Materials science Chemistry Microtechnology
247	JOURNAL OF APPLIED PHYSICS 103, 094503 共2008兲 Improved electrical properties of wafer-bonded p-GaAs/ n-InP interfaces with sulfide passivation Keisuke Nakayama,a兲 Katsuaki Tanabe, and Harry A. Atwaterb兲 Thomas J Add to Reading List Source URL: daedalus.caltech.edu Language: English - Date: 2008-05-19 11:10:48 Optoelectronics Energy conversion Phosphides Heterojunction Gallium arsenide Indium phosphide Multijunction photovoltaic cell Indium gallium arsenide Indium gallium phosphide Chemistry Solar cells Semiconductor devices
248	Solar energy conversion via hot electron internal photoemission in metallic nanostructures: Efficiency estimates Andrew J. Leenheer, Prineha Narang, Nathan S. Lewis, and Harry A. Atwater Citation: Journal of Applied Phys Add to Reading List Source URL: daedalus.caltech.edu Language: English - Date: 2014-04-01 18:49:32 Energy conversion Semiconductor devices Photovoltaics Vacuum tubes Thermionic emission Hot carrier injection Electron Schottky diode Multijunction photovoltaic cell Physics Electromagnetism Charge carriers
249	CALL FOR PAPERS IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing Special issue on “Hyperspectral remote sensing” Hyperspectral imaging is one of the fast moving areas of research and i Add to Reading List Source URL: www.grss-ieee.org Language: English - Date: 2014-09-02 11:57:57 Optics Infrared spectroscopy Infrared imaging Vision Hyperspectral imaging Physics IEEE Geoscience and Remote Sensing Society Spectral imaging Remote sensing Spectroscopy Science
250	JOURNAL OF APPLIED PHYSICS 105, 073514 共2009兲 Competing failure mechanisms in thin films: Application to layer transfer L. Ponson,a兲 K. Diest, H. A. Atwater, G. Ravichandran, and K. Bhattacharya Division of Engine Add to Reading List Source URL: daedalus.caltech.edu Language: English - Date: 2009-04-07 16:21:33 Solid mechanics Elasticity Deformation Buckling Strength of materials Fracture mechanics Stress intensity factor Fracture Bending Mechanics Physics Materials science

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